Novel TCAD oriented definition of the off-state breakdown voltage in Schottky-gate FETs: a 4H SiC MESFET case study

Physics-based breakdown voltage optimization in Schottky-barrier power RF and microwave field-effect transistors as well as in high-speed power-switching diodes is today an important topic in technology computer-aided design (TCAD). OFF-state breakdown threshold criteria based on the magnitude of the Schottky-barrier leakage current can be directly applied to TCAD; however, the results obtained are not accurate due to the large uncertainty in the Schottky-barrier parameters and models arising above all in advanced wide-gap semiconductors and to the need of performing high-temperature simulations to improve the numerical convergence of the model. In this paper, we suggest a novel OFF-state breakdown criterion, based on monitoring the magnitude (at the drain edge of the gate) of the electric field component parallel to the current density. The new condition is shown to be consistent with more conventional definitions and to exhibit a significantly reduced sensitivity with respect to physical parameter variation

Compact conversion and cyclostationary noise modelling of pn junction diodes in low-injection - Part I: Model derivation

Starting from the well known low-injection approximation, a closed form, analytical compact model is derived for the small-signal (SS) and forced quasi-periodic operation of junction diodes. The model determines the small-signal and conversion admittance matrix of the device as a function of the applied (dc or periodic-time varying) bias. Noise characteristics, in both the stationary (SS) and cyclostationary cases, are also evaluated by means of a Green's function approach